PLATON implements a variety of established techniques for correction for absorption.
All techniques listed below use the (De Facto) SHELX76-style of direction cosines (see below) for the specification of the primary and secondary beems through the crystal.
Clicking on each one of the tools listed below will bring up more detailed menu's and info on those utilities.
The reflection file should be formatted following the SHELX HKLF 4 Format.
h,k,l,F**2,sigma(F**2),N,IX,DX,IY,DY,IZ,DZ
FORMAT:(3I4,2F8.2,I4,6F8.5)
where
N is the batch number and
IX is the direction cosine of the reverse incident beam with the
reciprocal axis a*,
DZ the direction cosine of the diffracted beam with the
reciprocal axis c*.
THe validity of the direction cosines and their consistency with the cell dimensions provided is checked by default.
Checking can be overruled. However there should be very good reasons to do so. Common errors are related to inconsistent cell dimensions and wrong wavelength.